New model clarifies photoexcited thin-film lattice dynamics
WASHINGTON D.C., November 18, 2014 -- A research team from Germany developed an analytical model to describe the structural dynamics of photoexcited thin films and verified it by ultrafast X-ray diffraction.
Lattice dynamics, atomic movements in a crystal structure, can influence the physical and chemical properties of a material. The phenomenon can be directly studied using ultrafast X-ray diffraction, in which femtosecond X-ray pulses take snapshots of the atomic positions in a crystal by interacting with the structure at the core electronic level.
However, no comprehensive ...







