SKKU research team unravels the origin of stochasticity, a key to next-generation data security and computing
A joint research team led by Professor Jung Ho Yoon from the School of Advanced Materials Science and Engineering at Sungkyunkwan University (President Yoo Ji-Beom), in collaboration with Professor Kyeongtae Kim from the Department of Mechanical Engineering at Incheon National University (President Lee In-jae) and Dr. Sunghoon Hur of the Korea Institute of Science and Technology (KIST, President Sang Rok Oh), has reported for the first time that the resistive switching behavior of ion-motion-mediated volatile memristors, which are emerging as promising next-generation semiconductor devices, originates ...